We kindly invite you to join us for this live webinar where we will introduce a powerful new technique for nanoscale IR characterization: Resonance Enhanced Force Volume AFM-IR (REFV AFM-IR).

Nanoscale infrared microscopy enables label-free, chemical imaging and spectroscopy at the nanometer scale by combining atomic force microscopy (AFM) with infrared radiation. Over the years, different AFM-IR modes have been developed: The original photothermal-induced resonance enhanced mode and surface sensitive AFM-IR are based on contact mode, while Tapping AFM-IR is built on tapping mode. All of these nanoIR variations, however, have the inherent advantages and limitations of their respective AFM base mode.

Resonance Enhanced Force Volume (REFV) AFM-IR is a novel approach that relies on off-resonance tapping to simultaneously capture nanomechanical and nanochemical properties and deliver previously inaccessible insights into material properties.

Highlights of this webinar will include:

• Introduction to the REFV AFM-IR technique
• Outline of performing simultaneous multimodal imaging and spectroscopy
• Introduction to new mechanical tracking methods
• New applications offered by REFV AFM-IR
• Demonstration of the technique
• Q&A session - don’t miss the opportunity to pose your questions to our NanoIR experts

Dr. Peter De Wolf
Snr. Director, Research Science

Dr. Qichi Hu
Snr. Staff Applications Scientist