Monitoring the in-line quality control of wafer during production is of major importance in both front and back end of semiconductor processes. Recent technology advances in 3D Optical Metrology have helped ensure there are minimum defects in the final products.

Join this webinar to update your knowledge on 3D White Light Interferometer (WLI), a non-contact metrology system that improves yield, identifies root cause failure and drive the next generation device development from bare wafer to final packaged devices.

Webinar Speakers

TSOM Senior Product Specialist
Wee Chee Lau
Bruker Nano Surfaces Technology