Nanoelectrical Characterization Using Atomic Force Microscopy
Thursday, September 12 | 8AM PDT | 11AM EDT | 5PM CEST
Atomic force microscopy (AFM) has unique capabilities that make it ideal for nanoscale electrical characterization of properties including conductivity, resistivity, work function, surface potential, charge/carrier density, and dielectric/piezoelectric properties.
Join us for this free informative webinar to learn about:
- Challenges and advantages of common AFM modes used for nanoelectrical characterization
- Practical aspects of nanoelectrical characterization, including tip/cantilever selection, influence of environment, and quantification possibilities
- How nanoelectrical data can be correlated with AFM-based nanomechanical and nanochemical data
The webinar will include examples showing results on a variety of materials and devices.
Webinar Speakers
Peter De Wolf, Ph.D.
Bruker Nano Surfaces and Metrology
Khaled Kaja, Ph.D.
Bruker Nano Surfaces and Metrology
