Many processes in semiconductors, optical coatings, and micro-electromechanical systems (MEMS), as well as research in flexible electronics and sensors, depend on accurate thickness and etch-depth measurements. Among their various metrology capabilities, stylus profilers excel at delivering exceptional step height measurements at both the nanoscale and microscale.

In this webinar, we will explore how stylus profilers can characterize a diverse range of materials, particularly in microelectronics and semiconductor applications. Additionally, we will introduce Bruker’s new 11th generation Dektak Pro Stylus Profiler, providing even more enhanced operability, reliability, and measurement accuracy to enhance and extend the qualities that make Dektak synonymous with stylus profiling.

Webinar Speakers

Mr. Lau Wee Chee
Senior Product Specialist, Bruker Nano Surfaces and Metrology