In this webinar, Bruker nanoscale IR spectroscopy experts show how photothermal AFM-IR can identify the local chemistry of defects. With this detailed knowledge about chemistry, defect origins can be identified and eliminated.

AFM-IR is a unique, automation-capable technique that reaches beyond the capabilities of bulk spectroscopy or nanoscale elemental analysis methods. It has redefined the boundaries of nanoscale characterization for the semiconductor manufacturing industry.

Join us for this webinar to learn:

• What AFM-IR is and how it works
• Which parts of the semiconductor manufacturing process could be improved using nanoscale chemical analysis
• What level of automation can be achieved with Bruker’s AFM‑IR systems

Webinar Speakers

Chunzeng Li, Ph.D.
Bruker

Jin Hee Kim, Ph.D.
Bruker

Qichi Hu, Ph.D.
Bruker