
Atomic Force Microscopy for Advanced Surface Characterization and Metrology
Friday, February 14 | 11:30AM AEDT
Join us as we venture into the applications of how Bruker's latest AFM technology can help you in your research and work. Dimension Nexus™ delivers an ideal combination of data quality, experiment flexibility, and ease of use in a small-footprint system. It incorporates the milestone innovations of Bruker's NanoScope® 6 controller and PeakForce Tapping® technology to deliver more functionality than competing systems in its class. Suitable for both routine and custom experiments and easily upgradable in the field, Nexus consistently generates highly accurate, repeatable, publication-ready results for a wide range of sample types in both research and industry applications.
We look forward to seeing you in the webinar.
Webinar Speakers
Christian Gow
Coherent Scientific