
AFM Probes: From Fabrication to Functionality
Thursday, May 8 | 8AM PDT | 11AM EDT | 5PM CEST
Bruker, a leader in AFM technology, manufactures a diverse range of AFM probes designed to meet the needs of various research and industrial applications. In this webinar, Bruker AFM probe experts will describe the intricate fabrication process of Bruker's AFM probes and highlight the probes’ unique features, applications, and benefits.
Join us on a journey through the probe fabrication process at Bruker's state‑of‑the‑art facility in Camarillo, CA—where we turn raw material into packaged probes. We will showcase some exemplary probes at different levels of fabrication complexity:
- Silicon probes, such as RTESP‑300 for tapping mode in air on hard materials.
- Reflex-coated probes, such as SCANASYST‑FLUID for imaging biological samples in fluid.
- Probes with an added tip‑side coating, such as SCM‑PIT‑V2 for electrical modes.
- Sharpened silicon-tip probes, such as SAA‑HPI‑SS for ultrahigh‑resolution imaging.
- High aspect ratio probes using alternate tip processing methods, such as FIB2‑100A for depth metrology.
- Probes with defined shapes deposited using EBD, such as PFQNM‑LC‑V2 for mechanical testing.
By the end of the webinar, you will understand the probe manufacturing process and be equipped to make informed decisions for your applications. Whether experienced or new to AFM, this session will offer valuable insights and practical knowledge to enhance your use of AFM probes.
Webinar Speaker
Ian Armstrong, Ph.D.
Sr. Product Business Manager, AFM Probes
Bruker