We warmly invite you to join us for this webinar on the Hyperspectral Characterization of Advanced Materials using Atomic Force Microscopy (AFM).

AFM is widely used to determine the electrical, mechanical and chemical properties of samples at the nanometer scale. In this webinar, we will present an array of electrical AFM techniques that expand the capabilities of traditional AFM modes by enabling the collection of a spectrum in every XY pixel and the creation of rich multidimensional datasets, referred to as DataCubes.

DataCube modes, such as DataCube-TUNA, DataCube-PFM and DataCube-sMIM, as well as Hyperspectral AFM-IR and Force Volume AFM-IR allow the simultaneous capture of nanometer-scale electrical, chemical, and mechanical characteristics, and their correlation with spectra that reveal additional information, such as conduction type, charge, and performance transitions, information that was previously impossible to attain in a single measurement.

This hyperspectral approach significantly increases the ease and efficiency of material characterization and enables a comprehensive multidimensional, nanoscale analysis.

In this webinar, we will give an overview of Bruker’s DataCube modes and perform a live demonstration illustrating their capabilities.

Khaled Kaja
Sale Applications Engineer

Mickael Febvre
Bruker EMEA Applications Director